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X-ray photoelectron spectrometry depth profiling of organic thin films using C60 sputtering.
Authors: Ying-Yu Chen, Bang-Ying Yu, Wei-Ben Wang, Mao-Feng Hsu, Wei-Chun Lin, Yu-Chin Lin, Jwo-Huei Jou, Jing-Jong Shyue
Analytical chemistry 2008 Jan 15
Thought leaders and organizations working on research involving poly(ethylenedioxythiophene), poly(styrenesulfonic acid.
- Research Center for Applied Sciences
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